Characterization and modeling of power MOSFET switching times variations under constant electrical stress

Basit Öğe Kaydı
dc.contributor.authorSezgin, Hatice Gui
dc.contributor.authorOzcelep, Yasin
dc.date.accessioned2025-10-18T10:10:46Z
dc.date.created2015
dc.date.issued2015
dc.departmentBartın Üniversitesi
dc.description.abstractIn this paper, we proposed a simple and accurate degraded power MOSFET model for digital applications. The model provides to determine the electrical stress induced changes in power MOSFET switching characteristics. To establish the degraded power MOSFET and stress induced changes in switching parameters relation we consider the on-state-resistance of the power MOSFET as a voltage controlled resistor. We implemented a voltage non-linearly dependent resistor model in Pspice. We compared the experimental and simulation results to explore the model capability. (C) 2015 Elsevier Ltd. All rights reserved.
dc.description.sponsorshipIstanbul University Research Fund [31768]
dc.description.sponsorshipThe authors would like to thank Istanbul University Research Fund for this financial support. This work was partially supported by Istanbul University Research Fund with the project code 31768.
dc.identifier.doi10.1016/j.microrel.2015.01.002
dc.identifier.endpage497
dc.identifier.issn0026-2714
dc.identifier.issn1872-941X
dc.identifier.issue3-4
dc.identifier.orcidSezgin-Ugranli, Hatice Gul/0000-0003-1711-7806
dc.identifier.orcidOZCELEP, Yasin/0000-0002-5943-5952
dc.identifier.scopus2-s2.0-84923321407
dc.identifier.scopusqualityQ1
dc.identifier.startpage492
dc.identifier.urihttps://doi.org/10.1016/j.microrel.2015.01.002
dc.identifier.urihttps://hdl.handle.net/11772/22036
dc.identifier.volume55
dc.identifier.wosWOS:000350920500005
dc.identifier.wosqualityQ3
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoen
dc.publisherPergamon-Elsevier Science Ltd
dc.relation.ispartofMicroelectronics Reliability
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzWoS_20251016
dc.subjectElectrical Stress
dc.subjectPower Mosfet
dc.subjectMosfet Switch
dc.subjectDegradation Modeling
dc.titleCharacterization and modeling of power MOSFET switching times variations under constant electrical stress
dc.typeArticle
dspace.entity.typePublication

Dosyalar

Koleksiyon

WoS İndeksli Yayınlar Koleksiyonu
Scopus İndeksli Yayınlar Koleksiyonu