The influence of seed layer electroplating time on structural properties, optical energy bandgap, diameter, growth orientation and surface roughness of ZnO nanorods

dc.contributor.authorSaraç, Umut
dc.contributor.authorBaykul, M. Celalettin
dc.contributor.authorSaraç, Umut
dc.date.accessioned2025-10-18T13:24:53Z
dc.date.created2021
dc.date.issued2021
dc.departmentFakülteler, Eğitim Fakültesi, Matematik ve Fen Bilimleri Eğitimi Bölümü
dc.description.abstractIn this paper, the influence of the seed layer electroplating time (t(seed layer)) on the structural properties, optical energy bandgap, diameter, growth orientation and surface roughness of zinc oxide (ZnO) nanorods (NRs) electrochemically deposited from an oxygenated aqueous zinc chloride electrolyte solution was studied. Prior to actual electrochemical fabrication of subsequent ZnO NRs, the ZnO seed layers were first electroplated on the indium tin oxide (ITO) covered glass substrates at different t(seed layer) values of 25 s, 50 s and 100 s under a constant current density. The subsequent ZnO NRs were electrochemically deposited on the prepared ZnO seed layers at a constant cathode potential. For comparison, the ZnO NRs was also deposited on the ITO-covered glass substrates without a seed layer (t(seed layer) = 0 s). The surface morphologies of the ZnO NRs were characterized using an atomic force microscopy and a scanning electron microscopy. The results revealed that the shape of the ZnO NRs is affected by the t(seed layer) value and the diameter and surface roughness of the ZnO NRs can be reduced considerably by controlling the t(seed layer). The ZnO sample grown at the t(seed layer) of 50 s consisted of completely hexagonal-shaped NRs with the smallest mean diameter and exhibited the smoothest top surface. X-ray diffraction measurements confirmed the creation of the hexagonal wurtzite crystal structure for all samples. The ZnO NRs fabricated at the t(seed layer) of 50 s displayed the best preferential growth orientation along c-axis. Structural analysis also showed that the samples have nano-sized crystallites ranging from 50 to 56 nm. The ZnO NRs without the seed layer had an energy bandgap of 3.318 eV while the ZnO NRs prepared on the seed layers exhibited an energy bandgap value in the range of 3.370 +/- 0.006 eV, which was inversely proportional to the mean crystallite size of the samples.
dc.identifier.doi10.1007/s10854-021-07034-7
dc.identifier.endpage26587
dc.identifier.issn0957-4522
dc.identifier.issn1573-482X
dc.identifier.issue22
dc.identifier.orcidSarac, Umut/0000-0001-7657-173X;
dc.identifier.scopus2-s2.0-85115253239
dc.identifier.scopusqualityQ2
dc.identifier.startpage26578
dc.identifier.urihttps://doi.org/10.1007/s10854-021-07034-7
dc.identifier.urihttps://hdl.handle.net/11772/23171
dc.identifier.volume32
dc.identifier.wosWOS:000697610700003
dc.identifier.wosqualityQ2
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoen
dc.publisherSpringer
dc.relation.ispartofJournal of Materials Science-Materials in Electronics
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzWoS_20251016
dc.subjectThin-Films
dc.subjectNanostructured Materials
dc.subjectElectrodeposition
dc.subjectTransparent
dc.subjectArrays
dc.titleThe influence of seed layer electroplating time on structural properties, optical energy bandgap, diameter, growth orientation and surface roughness of ZnO nanorods
dc.typeArticle
dspace.entity.typePublication
relation.isAuthorOfPublicationf11bddf2-92d3-48b8-89e8-ea86869ca705
relation.isAuthorOfPublication.latestForDiscoveryf11bddf2-92d3-48b8-89e8-ea86869ca705

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