dc.contributor.author | Umut Sarac,M. Celalettin Baykul | |
dc.date.accessioned | 2023-02-10T12:32:45Z | |
dc.date.available | 2023-02-10T12:32:45Z | |
dc.date.issued | 2014 | |
dc.identifier | 10.1007/s10854-013-1546-y | |
dc.identifier.issn | 1573-482X | |
dc.identifier.uri | https://dx.doi.org/10.1007/s10854-013-1546-y | |
dc.identifier.uri | http://hdl.handle.net/11772/10793 | |
dc.source | JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS | |
dc.subject | Electrical and Electronic Engineering | |
dc.title | Evolution of surface roughness parameters and microstructure in two-phase nanocrystalline Co-Cu films electrodeposited onto ITO coated glass substrates at different deposition potentials | |
dc.type | Article | |
dc.identifier.volume | 25 | |
dc.identifier.issue | 1 | |