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Characterization and modeling of power MOSFET switching times variations under constant electrical stress

dc.contributor.authorHatice Gui Sezgin,Yasin Ozcelep
dc.date.accessioned2023-02-10T13:00:52Z
dc.date.available2023-02-10T13:00:52Z
dc.date.issued2015
dc.identifier10.1016/j.microrel.2015.01.002
dc.identifier.issn0
dc.identifier.urihttps://dx.doi.org/10.1016/j.microrel.2015.01.002
dc.identifier.urihttp://hdl.handle.net/11772/13360
dc.sourceMICROELECTRONICS RELIABILITY
dc.subjectElectrical and Electronic Engineering
dc.titleCharacterization and modeling of power MOSFET switching times variations under constant electrical stress
dc.typeArticle
dc.identifier.volume55
dc.identifier.issue3-4


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