dc.contributor.author | Umut Sarac,M. Celalettin Baykul | |
dc.date.accessioned | 2023-02-10T13:01:40Z | |
dc.date.available | 2023-02-10T13:01:40Z | |
dc.date.issued | 2013 | |
dc.identifier | 10.1007/s10854-013-1170-x | |
dc.identifier.issn | 1573-482X | |
dc.identifier.uri | https://dx.doi.org/10.1007/s10854-013-1170-x | |
dc.identifier.uri | http://hdl.handle.net/11772/13477 | |
dc.source | JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS | |
dc.subject | Electrical and Electronic Engineering | |
dc.title | Characterization of nanocrystalline Ni-Cu thin films electrodeposited onto ITO coated glass substrates: effect of pretreatment current density | |
dc.type | Article | |
dc.identifier.volume | 24 | |
dc.identifier.issue | 8 | |