Determination of Power MOSFET's Gate Oxide Degradation Under Different Electrical Stress Levels Based on Stress-Induced Oxide Capacitance Changes

Hatice Gul Sezgin-Ugranli,Yasin Ozcelep

Bartın Üniversitesi
Kurumsal Akademik Arşivi

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Determination of Power MOSFET's Gate Oxide Degradation Under Different Electrical Stress Levels Based on Stress-Induced Oxide Capacitance Changes

Date

2021

Author

Hatice Gul Sezgin-Ugranli,Yasin Ozcelep

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https://dx.doi.org/10.1109/TED.2020.3044269
http://hdl.handle.net/11772/9837

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